IEC 61937-3 Amd.1 Ed. 3.0 en:2020 Amendment 1 - Digital audio - Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 - Part 3: Non-linear PCM bitstreams according to the AC-3 and enhanced AC-3 formats Amendment by International Electrotechnical Commission, 09/22/2020
IEC 61937-3 Ed. 3.1 en:2020 Digital audio - Interface for non-linear PCM encoded audio bitstreams applying IEC 60958 - Part 3: Non-linear PCM bitstreams according to the AC-3 and enhanced AC-3 formats CONSOLIDATED EDITION standard by International Electrotechnical Commission, 09/22/2020
IEC 60747-17 Ed. 1.0 en:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation standard by International Electrotechnical Commission, 09/21/2020
IEC 60747-17 Ed. 1.0 b:2020 Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation standard by International Electrotechnical Commission, 09/21/2020
IEC 62977-2-2 Ed. 1.0 en:2020 Electronic displays - Part 2-2: Measurements of optical characteristics - Ambient performance standard by International Electrotechnical Commission, 09/21/2020
IEC 62793 Ed. 2.0 en:2020 Protection against lightning - Thunderstorm warning systems standard by International Electrotechnical Commission, 09/21/2020
IEC 61966-12-1 Ed. 2.0 b:2020 Multimedia systems and equipment - Colour measurement and management - Part 12-1: Metadata for identification of colour gamut (Gamut ID) standard by International Electrotechnical Commission, 09/21/2020
IEC 60601-2-35 Ed. 2.0 en:2020 Medical electrical equipment - Particular requirements for the safety of blankets, pads and mattresses intended for heating in medical use standard by International Electrotechnical Commission, 09/21/2020
IEC 60512-29-100 Ed. 1.0 b:2015 Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g standard by International Electrotechnical Commission, 03/05/2015
IEC 62047-17 Ed. 1.0 b:2015 Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films standard by International Electrotechnical Commission, 03/05/2015
IEC 62047-16 Ed. 1.0 b:2015 Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods standard by International Electrotechnical Commission, 03/05/2015
IEC 62047-15 Ed. 1.0 b:2015 [ Withdrawn ] Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding strength between PDMS and glass standard by International Electrotechnical Commission, 03/05/2015