IEC 60749-15 Ed. 3.0 b:2020 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices standard by International Electrotechnical Commission, 07/14/2020
IEC 60747-16-5 Amd.1 Ed. 1.0 en:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators Amendment by International Electrotechnical Commission, 07/14/2020
IEC 61496-1 Ed. 4.0 b:2020 Safety of machinery - Electro-sensitive protective equipment - Part 1: General requirements and tests standard by International Electrotechnical Commission, 07/14/2020
IEC 60747-16-5 Ed. 1.1 en:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators CONSOLIDATED EDITION standard by International Electrotechnical Commission, 07/14/2020
IEC 61000-3-2 Amd.1 Ed. 5.0 en:2020 Amendment 1 - Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current 16 A per phase) Amendment by International Electrotechnical Commission, 07/14/2020
IEC 61400-27-2 Ed. 1.0 en:2020 Wind energy generation systems - Part 27-2: Electrical simulation models - Model validation standard by International Electrotechnical Commission, 07/14/2020
IEC 60747-16-5 Ed. 1.1 b:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators CONSOLIDATED EDITION standard by International Electrotechnical Commission, 07/14/2020
IEC 61000-3-2 Ed. 5.1 en:2020 Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current 16 A per phase) CONSOLIDATED EDITION standard by International Electrotechnical Commission, 07/14/2020
IEC 62541-4 Ed. 3.0 b:2020 OPC Unified Architecture - Part 4: Services standard by International Electrotechnical Commission, 07/13/2020
IEC 63252 Ed. 1.0 b:2020 Energy consumption of vending machines standard by International Electrotechnical Commission, 07/13/2020
IEC 63152 Ed. 1.0 en:2020 Smart cities - City service continuity against disasters - The role of the electrical supply standard by International Electrotechnical Commission, 07/13/2020
IEC 63068-3 Ed. 1.0 b:2020 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence standard by International Electrotechnical Commission, 07/13/2020