> >IEC 60749-41 Ed. 1.0 b:2020
Reduced price! IEC 60749-41 Ed. 1.0 b:2020 View larger

IEC 60749-41 Ed. 1.0 b:2020

M00000962

New product

IEC 60749-41 Ed. 1.0 b:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

standard by International Electrotechnical Commission, 07/22/2020

More details

In stock

$72.16

-56%

$164.00

More info

Full Description

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

Product Details

Edition: 1.0 Published: 07/22/2020 Number of Pages: 44 File Size: 1 file , 1.5 MB