IEC 60749-30 Amd.1 Ed. 1.0 b:2011

IEC 60749-30 Amd.1 Ed. 1.0 b:2011 [ Withdrawn ] Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Amendment by International Electrotechnical Commission, 05/25/2011