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IEC 62526 Ed. 1.0 en:2007

M00001670

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IEC 62526 Ed. 1.0 en:2007 Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

standard by International Electrotechnical Commission, 11/07/2007

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Full Description

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

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Edition: 1.0 Published: 11/07/2007 Number of Pages: 123 File Size: 1 file , 1.5 MB