> >IEC 60512-6-2 Ed. 1.0 b:2002
Reduced price! IEC 60512-6-2 Ed. 1.0 b:2002 View larger

IEC 60512-6-2 Ed. 1.0 b:2002

M00001787

New product

IEC 60512-6-2 Ed. 1.0 b:2002 Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

standard by International Electrotechnical Commission, 02/21/2002

More details

In stock

$10.12

-56%

$23.00

More info

Full Description

Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.

Product Details

Edition: 1.0 Published: 02/21/2002 Number of Pages: 9 File Size: 1 file , 400 KB